Rigaku NANOHUNTER II TXRF spectrometer

The Rigaku NANOHUNTER II benchtop total reflection X-ray fluorescence (TXRF) spectrometer enables high-sensitivity ultratrace elemental analysis, in liquids or on solid surfaces, to the parts-per-billion (ppb) level. Total reflection X-ray fluorescence spectroscopy is a method by which an incident beam of X-rays just grazes the sample, delivering low background noise, high-sensitivity measurement of ultratrace elements.

The analyser combines a fully automatic optical axis adjustment system that provides stable analysis in an easily handled benchtop form factor, enabling quick and trouble-free operation. With a 600 W X-ray source, a mirror (optic) and a large-area silicon drift detector (SDD), the spectrometer enables high-intensity measurements. The lower limit of Cd detection is 2 ppb. For arsenic and selenium in a liquid, a detection lower limit of 0.8 ppb or less has been achieved.

The optic employed in the device can be used with a high-power excitation source of about 30 keV, which makes it possible to measure Kα lines with high signal-to-noise ratios and clearly defined peaks (when measuring Cd). Adoption of this capability is expected in fields such as the screening and analysis of factory waste liquids and the analysis of beverages, such as wine. Furthermore, because the spectrometer has the necessary functionality to vary the angle of incidence, it is possible to perform depth profile surface analyses.

Further capabilities include: detection of a wide range of elements, from aluminium to uranium; measurement of small sample quantities from 10–50 μL; and automatic operation through the use of a 16-sample changer mechanism. The device runs on 100 VAC power and does not require gas for analysis.