Piezoresponse force microscopy monograph
Asylum Research and Oak Ridge National Laboratory have released a 24-page monograph explaining the theory, functionality and applications of piezoresponse force microscopy (PFM).
The emergence of ferroelectric and multiferroic non-volatile memories and data storage devices has driven studies of electromagnetically active materials at the nanoscale, and PFM has emerged as a suitable tool for nanoscale imaging, spectroscopy and manipulation of these materials.
PFM is implemented on Asylum’s family of atomic force microscopes including the MFP-3D series and the Cypher AFM.
Phone: 0413 317 749
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