UV microscope
01 January, 2009 | Supplied by: Meeco Holdings Pty Ltd
Rigaku has launched the Desktop Minstrel UV, a fully automated UV imaging and protein crystal monitoring system. The instrument uses UV fluorescence microscopy to successfully monitor crystal growth by distinguishing protein crystals from non-protein crystals, such as salt.
FTIR/FTFIR spectrometer
01 January, 2009 | Supplied by: PerkinElmer (Australia) Pty Ltd
The Spectrum 400 FTIR/FTFIR is a dual-range spectrometer that combines mid-infrared (IR) and far-infrared (FIR) spectroscopy in a single instrument. With automatic beamsplitter changeover, it offers flexible performance for advanced research and industrial laboratories.
X-ray fluorescence spectrometer
01 January, 2009 | Supplied by: PANalytical
The Axios Fast simultaneous XRF system is a rapid, easy-to-use system suitable for routine analysis and dedicated real-time process control, with the flexibility to operate in industrial applications ranging from mining exploration to steelmaking.
Trace narcotics detection
01 January, 2009 | Supplied by: GE Pacific Pte Ltd - GE Sensing & IT
MobileTrace is a handheld trace detection instrument capable of simultaneous narcotics and explosives detection.
Range of COD analysers
03 December, 2008 | Supplied by: Aqua Diagnostic Pty Ltd
Aqua Diagnostic’s PeCOD COD analysers are a new technology for measuring COD and provide users with the benefits of real-time process control and environmental monitoring in industries involved in wastewater treatment, using coolant water or water feedstock or seawater in their manufacturing processes.
Aerosol backscatter analysis
01 December, 2008 | Supplied by: Ecotech Pty Ltd
The Aurora nephelometer is designed for use in backscatter global warming studies. It allows the analysis of aerosols by measuring their backscattering effect on light.
Temperature-controlled nanoparticle characterisation
01 December, 2008 | Supplied by: Particle & Surface Sciences Pty Ltd
NanoSight has announced additional temperature control capability for its family of instrumentation.
Pyranometer calibration
01 December, 2008 | Supplied by: Ecotech Pty Ltd
Ecotech has extended its NATA accredited services to include calibrations of pyranometers.
Coating thickness gauge
01 December, 2008 | Supplied by: SI Instruments
ElektroPhysik has released the MiniTest 700 range of digital coating thickness gauges featuring SIDSP technology.
Digital microscopy cameras
01 December, 2008 | Supplied by: SciTech Pty Ltd
Diagnostic Instruments Spot digital microscopy cameras provide an easy-to-use, comprehensive camera/software package. They range from colour CMOS cameras for brightfield to high-end, deeply cooled EMCCD cameras for ultra low light fluorescence.
Benchtop materials testing
01 December, 2008 | Supplied by: Power Parameters Pty Ltd
Tinius Olsen has released a range of benchtop-mounted universal testing machines ranging in capacity from 1 to 50 kN. The 1 and 5 kN machines are single column while the 10, 25 and 50 kN machines are dual column.
Thickness gauge
01 December, 2008 | Supplied by: IDM Instruments
The Thickness Gauge Digital Indicator with Stand is a small, lightweight instrument that can be used on many different materials. With a 12 mm range, a measuring foot of 5 mm and an accuracy of 0.003 mm, it is suitable for the laboratory or the production line.
Small sample AFM/SPM
01 December, 2008 | Supplied by: The Innovation Group Pty Ltd
Asylum Research’s Cypher AFM achieves closed loop atomic resolution using sensors in all three axes, combining the accuracy of closed loop with the power of atomic resolution for accurate images and measurements.
Universal tester
01 December, 2008 | Supplied by: IDM Instruments
Designed with dual testing capabilities, the Universal Testing Machine enables compression testing in the centre of the machine and tensile testing on the outer.
Handheld XRF analyser
01 December, 2008 | Supplied by: Oxford Instruments
The X-MET5100 X-ray fluorescence (XRF) analyser combines Oxford Instrument’s Silicon Drift Detector (SDD) with a 45 kV X-ray tube. This technology delivers fast, accurate measurement and allows light elements such as Mg, Al and Si to be measured without the need for complex vacuum pump or helium tank attachments.
