Rigaku NEX DE direct excitation EDXRF elemental analyser

The Rigaku NEX DE is a direct excitation energy dispersive X-ray fluorescence (EDXRF) elemental analyser. Engineered for heavy industrial use, whether on the plant floor or in remote field environments, the analyser was developed to maximise flexibility and ease of use.

The instrument was designed for demanding applications or for situations where analysis time or sample throughput is critical. It is suitable for exploration, research, bulk RoHS inspection and education, as well as industrial and production monitoring applications.

The analyser is equipped with a 60 kV, 12 W X-ray tube to deliver improvements in elemental peak resolution and counting statistics, resulting in good calibrations and precision for challenging measurements. The high voltage, along with multiple automated X-ray tube filters, provides a multi-element analysis capability for high performance with low limits of detection (LOD). With direct excitation, energy requirements are reduced.

Next-generation silicon drift detector (SDD) technology provides a high count rate capability with good spectral resolution. This enables the product to deliver high-precision analytical results in short measurement times. Peltier cooled semiconductor detector technology is incorporated to deliver good short-term repeatability and long-term reproducibility with high elemental peak resolution.

The optics are protected by a safety film that can be changed without tools. The system’s large sample chamber accommodates samples up to 30 cm in diameter and 10 cm tall, as well as a variety of single-position and autosampler options. Removable autosampler trays are interchangeable and support 32 and 40 mm cups.

The spectrometer is suitable for elemental analysis in basic quality control or its more sophisticated variants, such as analytical quality control, quality assurance or statistical process control.