Low-pressure liquid chromatography
01 January, 2009 | Supplied by: Bio-Rad Laboratories Pty Ltd
The Profinia protein purification system is an automated low-pressure liquid chromatography system that provides researchers a method to perform automated affinity purification and desalting of recombinant tagged proteins.
Trace narcotics detection
01 January, 2009 | Supplied by: GE Pacific Pte Ltd - GE Sensing & IT
MobileTrace is a handheld trace detection instrument capable of simultaneous narcotics and explosives detection.
Automated force spectroscopy
01 January, 2009 | Supplied by: SciTech Pty Ltd
JPK Instruments has released its ForceRobot system to automate force spectroscopy.
X-ray fluorescence spectrometer
01 January, 2009 | Supplied by: PANalytical
The Axios Fast simultaneous XRF system is a rapid, easy-to-use system suitable for routine analysis and dedicated real-time process control, with the flexibility to operate in industrial applications ranging from mining exploration to steelmaking.
Range of COD analysers
03 December, 2008 | Supplied by: Aqua Diagnostic Pty Ltd
Aqua Diagnostic’s PeCOD COD analysers are a new technology for measuring COD and provide users with the benefits of real-time process control and environmental monitoring in industries involved in wastewater treatment, using coolant water or water feedstock or seawater in their manufacturing processes.
Thickness gauge
01 December, 2008 | Supplied by: IDM Instruments
The Thickness Gauge Digital Indicator with Stand is a small, lightweight instrument that can be used on many different materials. With a 12 mm range, a measuring foot of 5 mm and an accuracy of 0.003 mm, it is suitable for the laboratory or the production line.
Tension and compression tester
01 December, 2008 | Supplied by: SI Instruments
The Mecmesin MultiTest-d test system is available in 1 and 2.5 kN capacities. The tester works in conjunction with a digital force gauge and forms an entry-level motorised test system for evaluating quality control parameters in tension and compression.
Photo diode array for LC systems
01 December, 2008 | Supplied by: PerkinElmer (Australia) Pty Ltd
The Series 275 HRes photo diode array is designed to accelerate productivity and performance for laboratories performing LC analysis. Coupled into a Series 275 HRes LC system, the product is claimed to provide improved peak identification and peak purity determination in addition to increased throughput.
Imaging plate X-ray diffractometer
01 December, 2008 | Supplied by: Meeco Holdings Pty Ltd
The Rigaku R-axis HTC imaging plate (IP) detector features a three-plate system that allows for simultaneous expose, erase and readout operations. This means that the duty cycle is limited only by the speed of the IP transport from one position to the next, making the R-AXIS HTC highly efficient for screening samples and suitable for experiments with brief exposure times. It combines the high-throughput capability of a CCD with the large aperture size and dynamic range of an IP.
Coating thickness gauge
01 December, 2008 | Supplied by: SI Instruments
ElektroPhysik has released the MiniTest 700 range of digital coating thickness gauges featuring SIDSP technology.
LC columns
01 December, 2008 | Supplied by: Dionex Pty Ltd
The Acclaim Rapid Separation LC (RSLC) 2 µm bonded silica columns provide a 2.1 mm internal diameter in both 50 and 100 mm lengths and are packed with Dionex C18 or Polar Advantage II (PA2) stationary phase.
Temperature-controlled nanoparticle characterisation
01 December, 2008 | Supplied by: Particle & Surface Sciences Pty Ltd
NanoSight has announced additional temperature control capability for its family of instrumentation.
X-ray diffractometer
01 December, 2008 | Supplied by: Varian Australia Pty Ltd
The SuperNova dual wavelength X-ray diffractometer from Oxford Diffraction is designed for the analysis of small molecules and proteins. The instrument uses high-intensity micro-source X-ray technology to determine the structure of small molecules and proteins at high resolution.
Handheld XRF analyser
01 December, 2008 | Supplied by: Oxford Instruments
The X-MET5100 X-ray fluorescence (XRF) analyser combines Oxford Instrument’s Silicon Drift Detector (SDD) with a 45 kV X-ray tube. This technology delivers fast, accurate measurement and allows light elements such as Mg, Al and Si to be measured without the need for complex vacuum pump or helium tank attachments.
Universal tester
01 December, 2008 | Supplied by: IDM Instruments
Designed with dual testing capabilities, the Universal Testing Machine enables compression testing in the centre of the machine and tensile testing on the outer.
