X-ray diffractometer
01 December, 2008 | Supplied by: Varian Australia Pty Ltd
The SuperNova dual wavelength X-ray diffractometer from Oxford Diffraction is designed for the analysis of small molecules and proteins. The instrument uses high-intensity micro-source X-ray technology to determine the structure of small molecules and proteins at high resolution.
Coating thickness gauge
01 December, 2008 | Supplied by: SI Instruments
ElektroPhysik has released the MiniTest 700 range of digital coating thickness gauges featuring SIDSP technology.
Universal tester
01 December, 2008 | Supplied by: IDM Instruments
Designed with dual testing capabilities, the Universal Testing Machine enables compression testing in the centre of the machine and tensile testing on the outer.
Thickness gauge
01 December, 2008 | Supplied by: IDM Instruments
The Thickness Gauge Digital Indicator with Stand is a small, lightweight instrument that can be used on many different materials. With a 12 mm range, a measuring foot of 5 mm and an accuracy of 0.003 mm, it is suitable for the laboratory or the production line.
Pyranometer calibration
01 December, 2008 | Supplied by: Ecotech Pty Ltd
Ecotech has extended its NATA accredited services to include calibrations of pyranometers.
Imaging plate X-ray diffractometer
01 December, 2008 | Supplied by: Meeco Holdings Pty Ltd
The Rigaku R-axis HTC imaging plate (IP) detector features a three-plate system that allows for simultaneous expose, erase and readout operations. This means that the duty cycle is limited only by the speed of the IP transport from one position to the next, making the R-AXIS HTC highly efficient for screening samples and suitable for experiments with brief exposure times. It combines the high-throughput capability of a CCD with the large aperture size and dynamic range of an IP.
Small sample AFM/SPM
01 December, 2008 | Supplied by: The Innovation Group Pty Ltd
Asylum Research’s Cypher AFM achieves closed loop atomic resolution using sensors in all three axes, combining the accuracy of closed loop with the power of atomic resolution for accurate images and measurements.
Handheld XRF analyser
01 December, 2008 | Supplied by: Oxford Instruments
The X-MET5100 X-ray fluorescence (XRF) analyser combines Oxford Instrument’s Silicon Drift Detector (SDD) with a 45 kV X-ray tube. This technology delivers fast, accurate measurement and allows light elements such as Mg, Al and Si to be measured without the need for complex vacuum pump or helium tank attachments.
LC columns
01 December, 2008 | Supplied by: Dionex Pty Ltd
The Acclaim Rapid Separation LC (RSLC) 2 µm bonded silica columns provide a 2.1 mm internal diameter in both 50 and 100 mm lengths and are packed with Dionex C18 or Polar Advantage II (PA2) stationary phase.
Photo diode array for LC systems
01 December, 2008 | Supplied by: PerkinElmer (Australia) Pty Ltd
The Series 275 HRes photo diode array is designed to accelerate productivity and performance for laboratories performing LC analysis. Coupled into a Series 275 HRes LC system, the product is claimed to provide improved peak identification and peak purity determination in addition to increased throughput.
Tension and compression tester
01 December, 2008 | Supplied by: SI Instruments
The Mecmesin MultiTest-d test system is available in 1 and 2.5 kN capacities. The tester works in conjunction with a digital force gauge and forms an entry-level motorised test system for evaluating quality control parameters in tension and compression.
Benchtop materials testing
01 December, 2008 | Supplied by: Power Parameters Pty Ltd
Tinius Olsen has released a range of benchtop-mounted universal testing machines ranging in capacity from 1 to 50 kN. The 1 and 5 kN machines are single column while the 10, 25 and 50 kN machines are dual column.
Aerosol backscatter analysis
01 December, 2008 | Supplied by: Ecotech Pty Ltd
The Aurora nephelometer is designed for use in backscatter global warming studies. It allows the analysis of aerosols by measuring their backscattering effect on light.
Triple quadrupole LC-MS/MS system
06 November, 2008 | Supplied by: http://www.thermo.com/tsqvantage
Thermo Fisher Scientific's TSQ vantage LC-MS/MS increases sensitivity without increasing noise for better reproducibility, accuracy and precision in quantitative analysis.
Counting hair
03 November, 2008
CSIRO has developed maths-based imaging technology to measure hair on different parts of the human body.
